articleTop 1% cited
Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)
Surface Science · 1973 · Vol. 35 · pp. 427–457
A. Benninghoven✉(University of Cologne)
Ion-surface interactions and analysisElectron and X-Ray Spectroscopy TechniquesSemiconductor materials and interfacesMonolayerAuger electron spectroscopySecondary ion mass spectrometryAnalytical Chemistry (journal)ChemistryStatic secondary-ion mass spectrometryElectron spectroscopyIonSpectroscopyMass spectrometry
Citations
445
FWCI
52.89
field-weighted impact
References
22
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100%
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Cited by
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Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)
Surface Science · 1973 · 445 citations
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