articleTop 1% cited
Developments in secondary ion mass spectroscopy and applications to surface studies
Surface Science · 1975 · Vol. 53(1) · pp. 596–625
A. Benninghoven✉(University of Münster)
Ion-surface interactions and analysisDiamond and Carbon-based Materials ResearchThin-Film Transistor TechnologiesPhotodiodePassivationOptoelectronicsDangling bondPhotocurrentMaterials scienceDark currentDiodeSiliconAnnealing (glass)
Citations
453
FWCI
38.20
field-weighted impact
References
26
Percentile
100%
vs. same field & year
Citations per year
Cited by
Interpretation of the x-ray photoemission spectra of cobalt oxides and cobalt oxide surfaces
Surface Science · 1976 · 979 citations
References
Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)
Surface Science · 1973 · 445 citations
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