Physical Sciences → Materials Science → Surfaces, Coatings and Films
Electron and X-Ray Spectroscopy Techniques
This cluster of papers focuses on surface analysis and electron spectroscopy techniques, including X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), electron inelastic mean free paths, ambient pressure photoelectron spectroscopy, and applications in surface science and nanomaterials characterization. It covers topics such as quantitative surface analysis, secondary electron emission, environmental scanning electron microscopy, and hard X-ray photoemission spectroscopy.
247.1K works worldwide1.8M citations
X-ray Photoelectron SpectroscopyScanning Electron MicroscopyElectron Inelastic Mean Free PathsAmbient Pressure Photoelectron SpectroscopySurface ScienceQuantitative Surface AnalysisSecondary Electron EmissionNanomaterials CharacterizationEnvironmental Scanning Electron MicroscopyHard X-ray Photoemission Spectroscopy
Journals publishing in this area
2
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
ISSN 0168-583X4,128 articles in this topic
179h-index
1.49Impact
42.3KArticles
558KCitations
9
Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment
ISSN 0168-90021,423 articles in this topic
225h-index
1.20Impact
55.4KArticles
817.1KCitations


