Physical Sciences → Engineering → Computational Mechanics
Ion-surface interactions and analysis
This cluster of papers focuses on the use of ion beam techniques, such as Secondary Ion Mass Spectrometry (SIMS) and swift heavy ions, for surface analysis, nanoscale patterning, and molecular imaging. It covers a wide range of applications including surface engineering, nanostructure fabrication, and depth profiling of biological samples.
74.7K works worldwide985.1K citations
Ion BeamSurface AnalysisSecondary Ion Mass SpectrometryNanoscale PatterningCluster IonTime-of-FlightMolecular ImagingSwift Heavy IonsSurface EngineeringNanostructures
Journals publishing in this area
1
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
ISSN 0168-583X12,170 articles in this topic
179h-index
1.49Impact
42.3KArticles
558KCitations
2
526h-index
2.41Impact
152.6KArticles
4.9MCitations
3
272h-index
5.17Impact
68.1KArticles
2MCitations
4
212h-index
2.50Impact
33.4KArticles
770.3KCitations
5
268h-index
1.87Impact
39.5KArticles
1.1MCitations
6
236h-index
1.18Impact
88.5KArticles
1.2MCitations
7
480h-index
5.59Impact
139.6KArticles
4.1MCitations
8
251h-index
2.20Impact
47.3KArticles
1.1MCitations
9
223h-index
5.86Impact
31.6KArticles
992.6KCitations
10
249h-index
1.48Impact
57.3KArticles
991.7KCitations
12
271h-index
2.41Impact
35.7KArticles
948.7KCitations