articleTop 10% cited
Oxygen vacancy model for the E1′ center in SiO2
Solid State Communications · 1974 · Vol. 14(3) · pp. 225–229
Glass properties and applicationsSilicon Nanostructures and PhotoluminescenceSemiconductor materials and devicesCenter (category theory)Hyperfine structureVacancy defectOxygenChemistryQuartzAtomic physicsCrystallographyPhysicsMaterials science
Citations
523
FWCI
6.52
field-weighted impact
References
16
Percentile
98%
vs. same field & year
Citations per year
Cited by
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References
Electron Spin Resonance
American Journal of Physics · 1968 · 1,684 citations
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