Scinovex
articleTop 1% cited

Characterization of three E'-center variants in X- and γ-irradiated high purity a-SiO2

David L. Griscom
Glass properties and applicationsLuminescence Properties of Advanced MaterialsNuclear materials and radiation effectsElectron paramagnetic resonanceHyperfine structureUnpaired electronIrradiationSiliconCrystallographyDangling bondMaterials scienceTetrahedronChemistry
Citations
287
FWCI
12.84
field-weighted impact
References
31
Percentile
100%
vs. same field & year
Citations per year
Cited by
Radiation effects and hardening of MOS technology: devices and circuits
IEEE Transactions on Nuclear Science · 2003 · 314 citations
Defect structure of glasses
Journal of Non-Crystalline Solids · 1985 · 446 citations
The nature of the trapped hole annealing process
IEEE Transactions on Nuclear Science · 1989 · 309 citations
Radiation Effects in Glasses Used for Immobilization of High-level Waste and Plutonium Disposition
Journal of materials research/Pratt's guide to venture capital sources · 1997 · 431 citations
Optically active oxygen-deficiency-related centers in amorphous silicon dioxide
Journal of Non-Crystalline Solids · 1998 · 1,291 citations
References
Electron spin resonance in glasses
Journal of Non-Crystalline Solids · 1980 · 538 citations
Oxygen vacancy model for the E1′ center in SiO2
Solid State Communications · 1974 · 523 citations
Oxygen-associated trapped-hole centers in high-purity fused silicas
Journal of Non-Crystalline Solids · 1979 · 443 citations
Citation Network

How this paper connects to the literature. Drag to explore, click any node to open that paper.