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Calibration of rectangular atomic force microscope cantilevers

Review of Scientific Instruments · 1999 · Vol. 70(10) · pp. 3967–3969

John E. Sader✉(University of Melbourne)James W. M. Chon(University of Melbourne)Paul Mulvaney(University of Melbourne)

Abstract

A method to determine the spring constant of a rectangular atomic force microscope cantilever is proposed that relies solely on the measurement of the resonant frequency and quality factor of the cantilever in fluid (typically air), and knowledge of its plan view dimensions. This method gives very good accuracy and improves upon the previous formulation by Sader et al. [Rev. Sci. Instrum. 66, 3789 (1995)] which, unlike the present method, requires knowledge of both the cantilever density and thickness.

Force Microscopy Techniques and Applications Mechanical and Optical Resonators Near-Field Optical MicroscopyCantileverCalibrationMicroscopeSpring (device)Atomic force microscopyMaterials scienceNon-contact atomic force microscopyMagnetic force microscopeConstant (computer programming)Atomic force acoustic microscopy

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Nanotribology and nanomechanics