articleTop 10% cited
Silicides and ohmic contacts
Materials Chemistry and Physics · 1998 · Vol. 52(2) · pp. 99–146
J. Gambino✉(IBM (United States))E. G. Colgan(IBM (United States))
Semiconductor materials and interfacesIntegrated Circuits and Semiconductor Failure AnalysisSilicon and Solar Cell TechnologiesOhmic contactSilicideMaterials scienceEngineering physicsNanotechnologyDopantCMOSOptoelectronicsSiliconMetallurgy
Citations
389
FWCI
6.48
field-weighted impact
References
319
Percentile
98%
vs. same field & year
Citations per year
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References
Transition metals in silicon
Applied Physics A · 1983 · 1,187 citations
Thin Films—Interdiffusion and Reactions
Journal of The Electrochemical Society · 1979 · 1,686 citations
Theory of Thermal Grooving
Journal of Applied Physics · 1957 · 2,589 citations
The Evolution of Silicon Wafer Cleaning Technology
Journal of The Electrochemical Society · 1990 · 1,654 citations
Kinetics of formation of silicides: A review
Journal of materials research/Pratt's guide to venture capital sources · 1986 · 418 citations
<i>Grain Boundaries in Metals</i>
Physics Today · 1958 · 1,930 citations
Nucleation of a new phase from the interaction of two adjacent phases: Some silicides
Journal of materials research/Pratt's guide to venture capital sources · 1988 · 396 citations
Grain boundaries in metals
Journal of Physics and Chemistry of Solids · 1958 · 825 citations
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