articleTop 1% cited
X-ray micro-tomography an attractive characterisation technique in materials science
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2003 · Vol. 200 · pp. 273–286
L Salvo✉(Institut polytechnique de Grenoble)Peter Cloetens(European Synchrotron Radiation Facility)Éric Maire(Institut National des Sciences Appliquées de Lyon)Simon Zabler(European Science Foundation)J.J. Blandin(Institut polytechnique de Grenoble)Jean‐Yves Buffière(Matériaux Ingénierie et Science)Wolfgang Ludwig(European Synchrotron Radiation Facility)E. Boller(European Synchrotron Radiation Facility)Daniel Bellet(Institut polytechnique de Grenoble)Charles Josserond(Institut polytechnique de Grenoble)
Advanced X-ray Imaging TechniquesElectron and X-Ray Spectroscopy TechniquesAdvanced Materials Characterization TechniquesTomographyMaterials scienceCharacterization (materials science)SuperplasticityElectron tomographyMaterial propertiesDeformation (meteorology)Composite materialNanotechnologyOptics
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References
Phase objects in synchrotron radiation hard x-ray imaging
Journal of Physics D Applied Physics · 1996 · 834 citations
On the possibilities of x-ray phase contrast microimaging by coherent high-energy synchrotron radiation
Review of Scientific Instruments · 1995 · 1,464 citations
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