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Phase objects in synchrotron radiation hard x-ray imaging

Journal of Physics D Applied Physics · 1996 · Vol. 29(1) · pp. 133–146
Peter CloetensR. BarrettJ. BaruchelJean‐Pierre GuigayM. Schlenker

Abstract

Phase objects are readily imaged through Fresnel diffraction in the hard x-ray beams of third-generation synchrotron radiation sources such as the ESRF, due essentially to the very small angular size of the source. Phase objects can lead to spurious contrast in x-ray diffraction images (topographs) of crystals. It is shown that this contrast can be eliminated through random phase plates, which provide an effective way of tailoring the angular size of the source. The possibilities of this very simple technique for imaging phase objects in the hard x-ray range are explored experimentally and discussed. They appear very promising, as shown in particular by the example of a piece of human vertebra, and could be extended to phase tomography.

Advanced X-ray Imaging TechniquesCrystallography and Radiation PhenomenaAdvanced Electron Microscopy Techniques and ApplicationsSynchrotron radiationOpticsDiffractionPhase (matter)PhysicsPhase-contrast imagingSynchrotronSpurious relationshipAngular diameterRadiation

Funding

  • European Synchrotron Radiation Facility
Citations
834
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32.10
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References
Surface Studies of Solids by Total Reflection of X-Rays
Physical Review · 1954 · 5,107 citations
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