articleTop 1% cited
Atomic Resolution with Atomic Force Microscope
Europhysics Letters (EPL) · 1987 · Vol. 3(12) · pp. 1281–1286
G. Binnig✉(IBM Research - Zurich)Ch. Gerber(IBM Research - Zurich)E. Stoll(IBM Research - Zurich)T. R. Albrecht(Stanford University)C. F. Quate(Stanford University)
Abstract
The atomic force microscope (AFM) is a promising new method for studying the surface structure of both conductors and insulators. In mapping a graphite surface with an insulating stylus, we have achieved a resolution better than 2.5 Å.
Force Microscopy Techniques and ApplicationsSurface and Thin Film PhenomenaElectron and X-Ray Spectroscopy TechniquesStylusConductive atomic force microscopyAtomic force microscopyMaterials scienceMagnetic force microscopeKelvin probe force microscopeResolution (logic)MicroscopeGraphiteSurface (topology)
Citations
546
FWCI
16.79
field-weighted impact
References
20
Percentile
100%
vs. same field & year
Citations per year
Cited by
Using force modulation to image surface elasticities with the atomic force microscope
Nanotechnology · 1991 · 519 citations
A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy
Review of Scientific Instruments · 1993 · 1,632 citations
References
Silicon as a mechanical material
Proceedings of the IEEE · 1982 · 2,858 citations
Atomic Force Microscope
Physical Review Letters · 1986 · 14,361 citations
Citation Network
How this paper connects to the literature. Drag to explore, click any node to open that paper.