articleTop 1% cited
Electrical and optical characterization of SiC
Physica B Condensed Matter · 1993 · Vol. 185(1-4) · pp. 264–283
Gerhard Pensl✉(Friedrich-Alexander-Universität Erlangen-Nürnberg)W. J. Choyke(University of Pittsburgh)
Silicon Carbide Semiconductor TechnologiesSemiconductor materials and devicesCopper Interconnects and ReliabilityCharacterization (materials science)Materials scienceOptoelectronicsAcceptorLuminescenceInfraredAbsorption (acoustics)SpectroscopyDeep-level transient spectroscopyNanotechnology
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Large-band-gap SiC, III-V nitride, and II-VI ZnSe-based semiconductor device technologies
Journal of Applied Physics · 1994 · 2,696 citations
References
Investigation of growth processes of ingots of silicon carbide single crystals
Journal of Crystal Growth · 1978 · 567 citations
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