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Surface defects of TiO2(110): A combined XPS, XAES AND ELS study

Surface Science · 1984 · Vol. 139(2-3) · pp. 333–346
W. GöpelJ. AndersonDaniel FrankelMilt JaehnigKatherine M. PhillipsJ. SchäferG. Rocker
Electron and X-Ray Spectroscopy TechniquesElectronic and Structural Properties of OxidesSemiconductor materials and devicesBinding energyIonX-ray photoelectron spectroscopyAugerChemistryAtomic physicsCrystallographic defectValence (chemistry)Band gapConduction band

Funding

  • National Science Foundation
  • Montana State University
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