reviewTop 10% cited
Microstructural parameters from X-ray peak profile analysis by Williamson-Hall models; A review
Materials Today Proceedings · 2021 · Vol. 47 · pp. 4891–4896
Himabindu Bantikatla✉(Koneru Lakshmaiah Education Foundation)N.S.M.P. Latha Devi(Koneru Lakshmaiah Education Foundation)Bhogoju Rajini Kanth
X-ray Diffraction in CrystallographyX-ray Spectroscopy and Fluorescence AnalysisElectron and X-Ray Spectroscopy TechniquesCrystalliteDiffractionIsotropyMaterials scienceScherrer equationX-ray crystallographyAnisotropyLattice (music)ScatteringLattice constant
Citations
221
FWCI
8.77
field-weighted impact
References
42
Percentile
99%
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Citations per year
References
Scherrer after sixty years: A survey and some new results in the determination of crystallite size
Journal of Applied Crystallography · 1978 · 3,698 citations
X-ray peak broadening studies of nanocrystalline hydroxyapatite by Williamson–Hall analysis
Physica B Condensed Matter · 2010 · 437 citations
X-ray peak broadening analysis in ZnO nanoparticles
Solid State Communications · 2009 · 573 citations
Microstructural parameters from X-ray diffraction peak broadening
Scripta Materialia · 2004 · 1,066 citations
Characterization techniques for nanoparticles: comparison and complementarity upon studying nanoparticle properties
Nanoscale · 2018 · 1,974 citations
X-ray diffraction analysis by Williamson-Hall, Halder-Wagner and size-strain plot methods of CdSe nanoparticles- a comparative study
Materials Chemistry and Physics · 2019 · 1,174 citations
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