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N-RADFET will able to replace P-RADFET

International journal of applied research · 2016 · Vol. 2(5) · pp. 958–960

Abstract

This paper proposes the concept of quasi sensitivity and ultimate sensitivity, thereby reveals the reason for exclusive R&D of P-channel Radiation Field Effect Transistor (P-RADFET). The N-RADFET that was generally negated could replace P-RADFET to become RADFET mainstream. Under identical conditions, N-RADFET’s ultimate sensitivity exceeds that of P-RADFET by 52.8%. The comparison is calculated based on the basic constant from published P-RADFET data. Therefore, this result does not need to do any experiments to verify.

Advancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devicesRadiation Effects in ElectronicsSensitivity (control systems)OptoelectronicsMaterials scienceTransistorPhysicsElectronic engineeringEngineeringVoltage
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N-RADFET will able to replace P-RADFET · Scinovex