articleTop 1% cited
Self-Consistent Results for<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>n</mml:mi></mml:math>-Type Si Inversion Layers
Physical review. B, Solid state · 1972 · Vol. 5(12) · pp. 4891–4899
Frank Stern✉(IBM (United States))
Abstract
Self-consistent results for energy levels, populations, and charge distributions are given for $n$-type inversion layers on $p$-type silicon. Quantum effects are taken into account in the effective-mass approximation, and the envelope wave function is assumed to vanish at the surface. Approximate analytic results are given for some special cases. Numerical results are given for representative surface orientations, bulk acceptor concentrations, inversion-layer electron concentrations, and temperatures.
Semiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignQuantum and electron transport phenomenaInversion (geology)Type (biology)Wave functionSiliconPhysicsMaterials scienceAtomic physicsGeologyOptoelectronics
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References
Semiconductor Surfaces
Surface Science · 1966 · 800 citations
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