article
Simultaneous determination of composition and thickness of thin iron-oxide films from XPS Fe 2p spectra
Applied Surface Science · 1996 · Vol. 100-101 · pp. 36–40
P. C. J. Graat(Delft University of Technology)Marcel A.J. Somers✉(Delft University of Technology)
Electron and X-Ray Spectroscopy TechniquesNon-Destructive Testing TechniquesX-ray Spectroscopy and Fluorescence AnalysisX-ray photoelectron spectroscopySpectral lineOxideAnalytical Chemistry (journal)Iron oxideMaterials scienceThin filmComposition (language)ElectronChemistry
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577
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2.09
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