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Soft x-ray scattering facility at the Advanced Light Source with real-time data processing and analysis

Review of Scientific Instruments · 2012 · Vol. 83(4) · pp. 045110–045110
Eliot GannA. T. YoungBrian A. CollinsHongping YanJ. NasiatkaH. A. PadmoreHarald AdeAlexander HexemerChenxi Wang

Abstract

We present the development and characterization of a dedicated resonant soft x-ray scattering facility. Capable of operation over a wide energy range, the beamline and endstation are primarily used for scattering from soft matter systems around the carbon K-edge (∼285 eV). We describe the specialized design of the instrument and characteristics of the beamline. Operational characteristics of immediate interest to users such as polarization control, degree of higher harmonic spectral contamination, and detector noise are delineated. Of special interest is the development of a higher harmonic rejection system that improves the spectral purity of the x-ray beam. Special software and a user-friendly interface have been implemented to allow real-time data processing and preliminary data analysis simultaneous with data acquisition.

Advanced X-ray Imaging TechniquesX-ray Spectroscopy and Fluorescence AnalysisEnzyme Structure and FunctionBeamlineOpticsData acquisitionScatteringDetectorPhysicsData processingBeam (structure)Computer science

Funding

  • U.S. Department of Energy
Citations
443
FWCI
34.59
field-weighted impact
References
53
Percentile
100%
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Citations per year
References
A SAXS/WAXS/GISAXS Beamline with Multilayer Monochromator
Journal of Physics Conference Series · 2010 · 534 citations
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