articleTop 1% cited
A reliability factor for surface structure determinations by low-energy electron diffraction
Surface Science · 1977 · Vol. 62(1) · pp. 61–80
E. Zanazzi✉(Stony Brook University)F. Jona(Stony Brook University)
Electron and X-Ray Spectroscopy TechniquesSurface Roughness and Optical MeasurementsX-ray Spectroscopy and Fluorescence AnalysisReliability (semiconductor)Low-energy electron diffractionSurface (topology)DiffractionElectron diffractionElectronChemistryValue (mathematics)Computational physicsStatistics
Funding
- National Science Foundation
Citations
429
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18.11
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10
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100%
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