article
LEED and Auger electron observations of the SiC(0001) surface
Surface Science · 1975 · Vol. 48(2) · pp. 463–472
A.J. Van Bommel✉(Philips (Netherlands))J.E. Crombeen(Philips (Netherlands))A. van Tooren(Philips (Netherlands))
Silicon Carbide Semiconductor TechnologiesAdvanced ceramic materials synthesisAluminum Alloys Composites PropertiesMonocrystalline siliconGraphiteMaterials scienceSiliconLayer (electronics)CrystallographyCrystal (programming language)EvaporationCrystalliteNanotechnology
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