articleTop 10% cited
Total pattern fitting for the combined size–strain–stress–texture determination in thin film diffraction
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2009 · Vol. 268(3-4) · pp. 334–340
Luca Lutterotti✉(University of Trento)
X-ray Diffraction in CrystallographyAdvanced ceramic materials synthesisX-ray Spectroscopy and Fluorescence AnalysisDiffractionTexture (cosmology)CrystalliteMaterials scienceThin filmOpticsPoint (geometry)Cover (algebra)Orientation (vector space)Crystal (programming language)
Citations
1,100
FWCI
8.49
field-weighted impact
References
26
Percentile
98%
vs. same field & year
Citations per year
References
Texture, residual stress and structural analysis of thin films using a combined X-ray analysis
Thin Solid Films · 2004 · 445 citations
The determination of the elastic field of an ellipsoidal inclusion, and related problems
Proceedings of the Royal Society of London A Mathematical and Physical Sciences · 1957 · 12,766 citations
<i>SUPERFLIP</i>– a computer program for the solution of crystal structures by charge flipping in arbitrary dimensions
Journal of Applied Crystallography · 2007 · 4,170 citations
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