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Texture, residual stress and structural analysis of thin films using a combined X-ray analysis
Thin Solid Films · 2004 · Vol. 450(1) · pp. 34–41
Luca Lutterotti✉(University of Trento)Daniel Chateigner(Laboratoire de Cristallographie et Sciences des Matériaux)S. FerrariJ. Ricote(Instituto de Ciencia de Materiales de Madrid)
X-ray Diffraction in CrystallographyMachine Learning in Materials ScienceX-ray Spectroscopy and Fluorescence AnalysisResidual stressGoniometerTexture (cosmology)DiffractometerOpticsDiffractionRietveld refinementResidualMaterials scienceCharacterization (materials science)
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