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Scanning near-field optical microscopy
Applied Physics A · 1994 · Vol. 59(2) · pp. 89–101
H. Heinzelmann✉(IBM Research - Zurich)Dieter Pohl(IBM Research - Zurich)
Near-Field Optical MicroscopyIntegrated Circuits and Semiconductor Failure AnalysisForce Microscopy Techniques and ApplicationsNear-field scanning optical microscopeOptical microscopeOpticsMicroscopyField (mathematics)Resolution (logic)Materials scienceScanning probe microscopyScanning ion-conductance microscopyScanning confocal electron microscopy
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References
Optical stethoscopy: Image recording with resolution λ/20
Applied Physics Letters · 1984 · 1,998 citations
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