article
Mechanical deflection of cantilever microbeams: A new technique for testing the mechanical properties of thin films
Journal of materials research/Pratt's guide to venture capital sources · 1988 · Vol. 3(5) · pp. 931–942
Timothy P. Weihs✉(Stanford University)Soon-Il Hong(Stanford University)J. C. Bravman(Stanford University)William D. Nix(Stanford University)
Force Microscopy Techniques and ApplicationsMetal and Thin Film MechanicsAdvanced Surface Polishing TechniquesNanoindenterMaterials scienceCantileverDeflection (physics)Thin filmIndentationComposite materialSurface micromachiningNanoindentationBeam (structure)
Funding
- University of California, Santa Barbara
- Office of Naval Research
Citations
377
FWCI
2.51
field-weighted impact
References
15
Percentile
89%
vs. same field & year
Citations per year
References
A method for interpreting the data from depth-sensing indentation instruments
Journal of materials research/Pratt's guide to venture capital sources · 1986 · 2,800 citations
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