articleTop 10% cited
The measurement of threading dislocation densities in semiconductor crystals by X-ray diffraction
Journal of Crystal Growth · 1994 · Vol. 135(1-2) · pp. 71–77
John E. Ayers✉(University of Connecticut)
Silicon and Solar Cell TechnologiesSemiconductor materials and interfacesElectron and X-Ray Spectroscopy TechniquesDislocationSemiconductorTransmission electron microscopyMaterials scienceCondensed matter physicsEpitaxyCrystallographyDiffractionOpticsOptoelectronics
Citations
473
FWCI
10.04
field-weighted impact
References
17
Percentile
99%
vs. same field & year
Citations per year
References
The estimation of dislocation densities in metals from X-ray data
Acta Metallurgica · 1953 · 516 citations
X-Ray Diffraction
Medical Entomology and Zoology · 1968 · 5,686 citations
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