articleTop 1% cited
Structure analysis of Si(111)-7 × 7 reconstructed surface by transmission electron diffraction
Surface Science · 1985 · Vol. 164(2-3) · pp. 367–392
Kunio Takayanagi✉(Tokyo Institute of Technology)Y. Tanishiro(Tokyo Institute of Technology)Shigeki Takahashi(Tokyo Institute of Technology)Masaetsu Takahashi(Tokyo Institute of Technology)
Electron and X-Ray Spectroscopy TechniquesAdvanced Electron Microscopy Techniques and ApplicationsSurface and Thin Film PhenomenaStacking faultDangling bondDiffractionElectron diffractionStackingSiliconIntensity (physics)Surface reconstructionCrystallographyMaterials science
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References
Current Topics in Materials Science
Journal of The Electrochemical Society · 1980 · 2,266 citations
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