articleTop 10% cited
Electrical properties and defect model of tin-doped indium oxide layers
Applied Physics A · 1982 · Vol. 27(4) · pp. 197–206
Gerhard Frank✉(Philips (Germany))Heiner K�stlin(Philips (Germany))
ZnO doping and propertiesGas Sensing Nanomaterials and SensorsElectronic and Structural Properties of OxidesMaterials sciencePartial pressureTinDopingOxygenAnalytical Chemistry (journal)ImpurityIndiumElectron mobilityElectrical resistivity and conductivity
Citations
617
FWCI
6.69
field-weighted impact
References
38
Percentile
97%
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Citations per year
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