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The X-ray Fluorescence Microscopy Beamline at the Australian Synchrotron
AIP conference proceedings · 2011 · pp. 219–222
David Paterson✉Martin D. de JongeDaryl L. HowardW. F. LewisJonathan McKinlayAndrew StarrittMichael Kusel(Australian Synchrotron)C.G. RyanR. KirkhamG. F. Moorhead(CSIRO Manufacturing)D. P. Siddons(Brookhaven National Laboratory)Ian McNultyCatherine EybergerBarry Lai
Abstract
A hard x‐ray micro‐nanoprobe has commenced operation at the Australian Synchrotron providing versatile x‐ray fluorescence microscopy across an incident energy range from 4 to 25 keV. Two x‐ray probes are used to collect μ‐XRF and μ‐XANES for elemental and chemical microanalysis: a Kirkpatrick‐Baez mirror microprobe for micron resolution studies and a Fresnel zone plate nanoprobe capable of 60‐nm resolution. Some unique aspects of the beamline design and operation are discussed. An advanced energy dispersive x‐ray fluorescence detection scheme named Maia has been developed for the beamline, which enables ultrafast x‐ray fluorescence microscopy.
X-ray Spectroscopy and Fluorescence AnalysisAdvanced X-ray Imaging TechniquesElectron and X-Ray Spectroscopy TechniquesBeamlineMicroprobeSynchrotronMicroscopyOpticsMaterials scienceNanoprobeFluorescenceFluorescence microscopeSynchrotron radiation
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