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Kelvin probe force microscopy

Applied Physics Letters · 1991 · Vol. 58(25) · pp. 2921–2923

M. Nonnenmacher✉M. O’BoyleH. K. Wickramasinghe

Abstract

Measurements of the contact potential difference between different materials have been performed for the first time using scanning force microscopy. The instrument has a high resolution for both the contact potential difference (better than 0.1 mV) and the lateral dimension (&lt;50 nm) and allows the simultaneous imaging of topography and contact potential difference. Images of gold, platinum, and palladium surfaces, taken in air, show a large contrast in the contact potential difference and demonstrate the basic concept.

Force Microscopy Techniques and Applications Mechanical and Optical Resonators Integrated Circuits and Semiconductor Failure AnalysisVolta potentialKelvin probe force microscopeMicroscopyPotential differenceMaterials sciencePlatinumScanning probe microscopyOpticsAtomic force microscopyNanotechnology

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