Mathematical Correction for Stress in Removed Layers in X-Ray Diffraction Residual Stress Analysis

Abstract

<div class="section abstract"><div class="htmlview paragraph">DETERMINATION of subsurface residual stresses by X-ray diffraction and layer removal requires correction in the stresses as measured. The significance of the correction is proportional to the magnitude of relieved stress in the layer and to the depths involved.</div><div class="htmlview paragraph">Correction formulas are developed for the solid circular cylinder, the hollow cylinder or tube, and the flat plate. Symmetric and non-symmetric peripheral stresses are taken for the solid cylinder. Examples are shown and limitations and applications of the formulas are discussed.</div></div>