Analysis of genetic variability parameters for grain yield and its attributing traits in sorghum [Sorghum bicolor (L.) Moench]

Abstract

The present research trial was conducted during Kharif (2024) to assess genetic variability parameters among 60 sorghum genotypes. The experiment was laid out in an Augmented Randomised Complete Block Design (ARCBD) at the Instructional Research Farm, MPUAT, Udaipur. The mean sum of squares from the analysis of variance (ANOVA) for the characters under study indicated that the majority of the treatments or genotypes exhibited significant differences for all traits evaluated, indicating the existence of enormous genetic variability among different genotypes for these traits studied. Grain yield per plant, dry fodder yield, harvest index and biological yield exhibited high GCV and PCV values, indicating a wide range of genetic variability and strong potential for improvement through selection. Moderate variability was also observed in traits such as flag leaf length, panicle width, protein content, plant height and number of leaves per plant, suggesting that these traits are under genetic control and can be effectively improved through breeding. Traits like number of leaves per plant, panicle width, dry fodder yield, stem girth and protein content showed very high heritability, indicating that their expression is largely governed by genetic factors. Grain yield and flag leaf length also exhibited strong genetic control. These traits, along with harvest index, biological yield and plant height, showed high genetic gain, suggesting the influence of additive gene action and making them highly suitable for direct selection in sorghum improvement programs.