Correlation and path coefficient analysis for yield and its related traits in rice (Oryza sativa L.)

Abstract

In-depth understanding on relationship between crop yield and its related traits is very crucial for every crop improvement programme. Considering the importance of trait association, present investigation has been done to find out interdependency among various traits and their effect on yield.132 rice germplasm has been evaluated along with 4 local checks using augmented randomized complete block design. Data were recorded on 14 quantitative traits. Results indicated that the crop yield has significant positive association with flag leaf breadth (0.283**) and flag leaf area (0.220*) and significant negative correlation with flag leaf length breadth ratio (-0.236**), grain length (-0.235**) and grain length breadth ratio (-0.174*). Inter-character correlation showed many significant positive and negative associations between various traits. Flag leaf length revealed significant positive correlation with flag leaf breadth (0.257**), flag leaf length breadth ratio (0.479**), flag leaf area (0.703**) and grain length (0.185*). Results of path coefficient analysis revealed that flag leaf area has highest positive direct effect on yield (0.739) followed by days to maturity (0.588). Highest negative direct effect on yield was exhibited by days to 50 percent flowering (-0.616) followed by flag leaf breadth (-0.38885), flag leaf length (-0.28213), grain length(-0.17095) and flag leaf length breadth ratio(-0.16353). Increase in crop yield is associated with increase in flag leaf area. Above results showed that flag leaf breadth and flag leaf area were most important trait that can be used as selection criteria.