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Using Deep Learning to Detect Defects in Manufacturing: A Comprehensive Survey and Current Challenges

Materials · 2020 · Vol. 13(24) · pp. 5755–5755
Jing YangShaobo LiZheng WangHao DongJun WangShihao Tang

Abstract

The detection of product defects is essential in quality control in manufacturing. This study surveys stateoftheart deep-learning methods in defect detection. First, we classify the defects of products, such as electronic components, pipes, welded parts, and textile materials, into categories. Second, recent mainstream techniques and deep-learning methods for defects are reviewed with their characteristics, strengths, and shortcomings described. Third, we summarize and analyze the application of ultrasonic testing, filtering, deep learning, machine vision, and other technologies used for defect detection, by focusing on three aspects, namely method and experimental results. To further understand the difficulties in the field of defect detection, we investigate the functions and characteristics of existing equipment used for defect detection. The core ideas and codes of studies related to high precision, high positioning, rapid detection, small object, complex background, occluded object detection and object association, are summarized. Lastly, we outline the current achievements and limitations of the existing methods, along with the current research challenges, to assist the research community on defect detection in setting a further agenda for future studies.

Industrial Vision Systems and Defect DetectionNon-Destructive Testing TechniquesThermography and Photoacoustic TechniquesComputer scienceDeep learningObject detectionArtificial intelligenceField (mathematics)Product (mathematics)Machine learningData sciencePattern recognition (psychology)

Funding

  • National Natural Science Foundation of China
  • Guizhou Science and Technology Department
Citations
453
FWCI
44.02
field-weighted impact
References
179
Percentile
100%
vs. same field & year
Citations per year
Cited by
References
Faster R-CNN: Towards Real-Time Object Detection with Region Proposal Networks
IEEE Transactions on Pattern Analysis and Machine Intelligence · 2016 · 52,930 citations
Salient Object Detection: A Benchmark
IEEE Transactions on Image Processing · 2015 · 1,319 citations
Spatial Pyramid Pooling in Deep Convolutional Networks for Visual Recognition
IEEE Transactions on Pattern Analysis and Machine Intelligence · 2015 · 11,231 citations
Gradient-based learning applied to document recognition
Proceedings of the IEEE · 1998 · 57,014 citations
Fully Convolutional Networks for Semantic Segmentation
IEEE Transactions on Pattern Analysis and Machine Intelligence · 2016 · 10,957 citations
Automated Melanoma Recognition in Dermoscopy Images via Very Deep Residual Networks
IEEE Transactions on Medical Imaging · 2016 · 1,118 citations
A fast and robust convolutional neural network-based defect detection model in product quality control
The International Journal of Advanced Manufacturing Technology · 2017 · 485 citations
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