Reliability computation of system reliability of a stress-strength model with new Rayleigh Pareto distribution

Abstract

In this paper presents the reliability computation of system reliability when the applied stress and strength follows the New Rayleigh Pareto distribution. The New Rayleigh Pareto Distribution (NRPD) is considered as a simple model to make component reliability and may place a good fit for failure data and also provide more appropriate information about hazard rate. The results may be applied to semiconductor devices. Maximum likelihood estimator are used here.