Screening of mungbean genotypes against leaf blight pathogen Macrophomina phaseolina (Tassi) goid

Abstract

Leaf Blight of Mungbean caused by Macrophomina phaseolina (Tassi) Goid is one of the more severe yield destabilizing factors causing serious yield losses each year in Central India. Mungbean was observed severely affected by leaf blight in Kharif as well as during summer season. A total of 52 germplasm lines of mungbean were screened against Macrophomina blight at Pulse Pathology Field, Block Number-23 of University Research Farm, Raipur with two replications each. Per cent incidence was recorded on the basis of visual observation according to 1-5 scale given by IIPR, Kanpur. Out of 52 entries of mungbean screened for Macrophomina blight under natural field conditions, 21 cultivar found resistant, 16 cultivar found moderately resistant, 5 cultivar found moderately susceptible, 9 cultivar found susceptible and KPM 16-50 were found highly susceptible whereas KPM 16-50 used as susceptible check in sick plot of these test lines.