RideNN: A New Rider Optimization Algorithm-Based Neural Network for Fault Diagnosis in Analog Circuits

Abstract

Fault diagnosis in electronic circuits is an emerging area of research, where fully automated diagnosis systems are being developed for the investigation of the circuits. Developing test methods for the diagnosis of faults in analog circuits is still a complex task. Consequently, a technique for the fault diagnosis in analog circuits is designed by proposing a new optimization algorithm, named, rider optimization algorithm (ROA). The development of ROA is based on a group of riders, racing toward a target location. Moreover, a classifier, termed RideNN, is developed by including the proposed algorithm as the training algorithm for the neural network (NN). RideNN, along with the orthogonal transformation and Bhattacharyya coefficient, is applied for the fault diagnosis of analog circuits. The proposed technique is experimented using three basic circuits, such as triangular wave generator (TWG), low noise bipolar transistor amplifier (BTA), and differentiator (DIF) and an application circuit, solar power converter (SPC). The performance is evaluated using two evaluation metrics, namely, accuracy (ACC) and false alarm ratio (FAR). The analysis results show that the proposed technique attains an ACC of 99.9% in TWG, 99.9% in BTA, 99% in DIF, and 95% in SPC without noise.