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Re-Establishing concurrent validity & reliability of ‘Multiple intelligence level-scale’ to assess dominant thinking pattern
International Journal of Academic Research and Development · 2016 · Vol. 1(9) · pp. 01–06
Emotional Intelligence and PerformanceConcurrent validityScale (ratio)Reliability (semiconductor)PsychologyValidityTest validityApplied psychologyReliability engineeringComputer sciencePsychometrics
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