article
Study of static noise margin of SRAM based on supply voltage and topologies
International journal of applied research · 2016 · Vol. 2(5) · pp. 285–288
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisLow-power high-performance VLSI designNetwork topologyNoise marginStatic random-access memoryMargin (machine learning)Noise (video)VoltageElectronic engineeringTopology (electrical circuits)Electrical engineeringComputer science
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