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In-Memory Computation of a Machine-Learning Classifier in a Standard 6T SRAM Array

IEEE Journal of Solid-State Circuits · 2017 · Vol. 52(4) · pp. 915–924
Jintao ZhangZhuo WangNaveen Verma

Abstract

This paper presents a machine-learning classifier where computations are performed in a standard 6T SRAM array, which stores the machine-learning model. Peripheral circuits implement mixed-signal weak classifiers via columns of the SRAM, and a training algorithm enables a strong classifier through boosting and also overcomes circuit nonidealities, by combining multiple columns. A prototype 128 × 128 SRAM array, implemented in a 130-nm CMOS process, demonstrates ten-way classification of MNIST images (using image-pixel features downsampled from 28 × 28 = 784 to 9 × 9 = 81, which yields a baseline accuracy of 90%). In SRAM mode (bit-cell read/write), the prototype operates up to 300 MHz, and in classify mode, it operates at 50 MHz, generating a classification every cycle. With accuracy equivalent to a discrete SRAM/digital-MAC system, the system achieves ten-way classification at an energy of 630 pJ per decision, 113× lower than a discrete system with standard training algorithm and 13× lower than a discrete system with the proposed training algorithm.

Advanced Memory and Neural ComputingLow-power high-performance VLSI designQuantum-Dot Cellular AutomataStatic random-access memoryMNIST databaseComputer scienceComputationBoosting (machine learning)Classifier (UML)Artificial intelligenceComputer hardwareAlgorithmArtificial neural network
Citations
508
FWCI
21.56
field-weighted impact
References
25
Percentile
100%
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Citations per year
References
Static-noise margin analysis of MOS SRAM cells
IEEE Journal of Solid-State Circuits · 1987 · 1,415 citations
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