article

X-ray diffraction line profile analysis of Ba Sr0.6 Fe0.4 TiO3 (BSFTO)

International Journal of Chemical Studies · 2015 · Vol. 2(5) · pp. 12–21

Abstract

BSFTO nanoparticles prepared by solid state technique are characterized by X-ray diffraction analysis (XRD) and SEM. The crystallite development in the BSFTO is investigated by X-ray peak broadening methods like Scherrer method, Williamson Hall (W-H) plot analysis and Size -Strain plot method. The contributions of dislocation density due to crystallite size are also evaluated. A well defined peroskvite phase with tetragonal system is observed from the XRD data. The results showed that the mean crystallite size of the BSFTO estimated from the different methods are highly inter correlated. SEM data revealed that BSFTO has nano crystallite size and EDAX spectrum confirmed its elemental composition.

X-ray Diffraction in Crystallography Magnetic Properties and Synthesis of Ferrites Multiferroics and related materialsCrystalliteTetragonal crystal systemScherrer equationDiffractionMaterials scienceAnalytical Chemistry (journal)X-ray crystallographyCrystallographyMineralogyChemistry

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0.42

field-weighted impact

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62%

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Citations per year

The use of X-ray diffraction peak profile analysis to determine the structural parameters of cobalt ferrite nanoparticles using Debye-Scherrer, Williamson-Hall, Halder-Wagner and Size-strain plot: Different precipitating agent approach

Journal of Alloys and Compounds · 2021 · 400 citations

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