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Modern Applied Statistics With S

Technometrics · 2003 · Vol. 45(1) · pp. 111–111
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Abstract

AII rip .-veci. ThiII wodt may not be InlllIaJed or copied in wbole or in part wllboul tbe wrilten penuission of ilie pnblilher (Springer Science+Business Media, LLC ), exc:eptlbr bdcf lIIlCIIJIII in connecIion witb mviewI or sc:boIariy _ysis. Use in conneclion wilb III)' fomI 01 infonnaIion lIOIIp IOd lIIIrievII, eIecIIoaic: ldIptIIian, CDqJUter softwam, ar by limillr OI'

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