articleTop 1% cited
Phenomenological model of anisotropic peak broadening in powder diffraction
Journal of Applied Crystallography · 1999 · Vol. 32(2) · pp. 281–289
Peter W. Stephens✉(Stony Brook University)
Abstract
Anisotropic line-shape broadening (peak width which is not a smooth function of d -spacing) is frequently observed in powder diffraction patterns, and can be a source of considerable difficulty for whole-pattern fitting or Rietveld analysis. A model of the multi-dimensional distribution of lattice metrics within a powder sample is developed, leading naturally to a few parameters which can be varied to achieve optimal line-shape fits. Conditions on these parameters are derived for all crystal systems, and the method is illustrated with two examples: sodium p -hydroxybenzoate and rubidium fulleride.
X-ray Diffraction in CrystallographyNuclear materials and radiation effectsCrystal Structures and PropertiesAnisotropyRubidiumDiffractionRietveld refinementPowder diffractionMaterials scienceLine (geometry)Lattice (music)Pair distribution functionPhenomenological model
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References
The effect of dislocation contrast on x-ray line broadening: A new approach to line profile analysis
Applied Physics Letters · 1996 · 1,305 citations
Ab-initio structure determination of LiSbWO6 by X-ray powder diffraction
Materials Research Bulletin · 1988 · 2,624 citations
Rietveld refinement of Debye–Scherrer synchrotron X-ray data from Al<sub>2</sub>O<sub>3</sub>
Journal of Applied Crystallography · 1987 · 2,721 citations
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