articleTop 10% cited

Destructive single-event effects in semiconductor devices and ICs

IEEE Transactions on Nuclear Science · 2003 · Vol. 50(3) · pp. 603–621

F.W. Sexton✉(Sandia National Laboratories)

Abstract

Developments in the field of destructive single-event effects over the last 40 years are reviewed. Single-event latchup, single-event burnout, single-event gate rupture, and single-event snap-back are discussed beginning with the first observation of each effect, its phenomenology, and the development of present day understanding of the mechanisms involved.

Radiation Effects in Electronics Integrated Circuits and Semiconductor Failure Analysis VLSI and Analog Circuit TestingEvent (particle physics)Semiconductor deviceSingle event upsetPhenomenology (philosophy)EngineeringEngineering physicsElectrical engineeringElectronic engineeringReliability engineeringPhysics

Citations

264

FWCI

4.24

field-weighted impact

References

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94%

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Citations per year

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References

Electrons and holes in semiconductors

Journal of the Franklin Institute · 1951 · 1,180 citations

Satellite Anomalies from Galactic Cosmic Rays

IEEE Transactions on Nuclear Science · 1975 · 404 citations

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