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Structural determination of some MPS3 layered phases (M = Mn, Fe, Co, Ni and Cd)

Materials Research Bulletin · 1985 · Vol. 20(10) · pp. 1181–1189
G. OuvrardR. BrecJ. Rouxel
Chalcogenide Semiconductor Thin FilmsSemiconductor materials and interfacesOrganometallic Compounds Synthesis and Characterizationvan der Waals forceStoichiometryCrystal structureCationic polymerizationCrystallographyChemistryMaterials sciencePhysical chemistryMolecule
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Structural determination of some MPS3 layered phases (M = Mn, Fe, Co, Ni and Cd) · Scinovex