articleTop 10% cited
Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer
IEEE Transactions on Microwave Theory and Techniques · 1979 · Vol. 27(12) · pp. 987–993
Glenn F. Engen✉(National Institute of Standards and Technology)C.A. Hoer(National Institute of Standards and Technology)
Abstract
In an earlier paper, the use of a "thru-short-delay" (TSD) technique for calibrating the dual six-port automatic network analyzer was described. Another scheme required only a length of precision transmission line and a "calibration circuit." The better features of these two somewhat different approaches have now been combined and the requirement for either a known short, or a "calibration circuit" eliminated. This paper will develop the theory for this new procedure.
Microwave and Dielectric Measurement TechniquesMagneto-Optical Properties and ApplicationsAdvancements in PLL and VCO TechnologiesNetwork analyzer (electrical)CalibrationPort (circuit theory)Computer scienceTransmission lineLine (geometry)Electronic engineeringSpectrum analyzerDual (grammatical number)Electrical engineering
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4.74
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Cited by
A multiline method of network analyzer calibration
IEEE Transactions on Microwave Theory and Techniques · 1991 · 1,250 citations
References
The Six-Port Reflectometer: An Alternative Network Analyzer
IEEE Transactions on Microwave Theory and Techniques · 1977 · 622 citations
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