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Determination of effective capacitance and film thickness from constant-phase-element parameters
Electrochimica Acta · 2009 · Vol. 55(21) · pp. 6218–6227
Bryan Hirschorn(University of Florida)Mark E. Orazem✉(University of Florida)Bernard Tribollet(Centre National de la Recherche Scientifique)Vincent Vivier(Centre National de la Recherche Scientifique)Isabelle Frateur(Chimie ParisTech)Marco Musiani(Institute for Energetics and Interphases)
Non-Destructive Testing TechniquesSmart Materials for ConstructionAnodic Oxide Films and NanostructuresCapacitanceConstant phase elementConstant (computer programming)Materials sciencePhase (matter)Range (aeronautics)Electrical resistivity and conductivityCapacitance probeDistribution (mathematics)Mechanics
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