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Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy

Optics Communications · 2000 · Vol. 182(4-6) · pp. 321–328
B. KnollF. Keilmann
Near-Field Optical MicroscopyIntegrated Circuits and Semiconductor Failure AnalysisSurface and Thin Film PhenomenaOpticsNear-field scanning optical microscopeMaterials scienceScatteringNear and far fieldResolution (logic)Aperture (computer memory)DielectricLaserMicroscopy
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Surface plasmon polaritons: physics and applications
Journal of Physics D Applied Physics · 2012 · 587 citations
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Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy · Scinovex