articleTop 1% cited
A field ion microscope study of atomic configuration at grain boundaries
Acta Metallurgica · 1964 · Vol. 12(7) · pp. 813–821
D. G. Brandon✉(University of Cambridge)Ralph B. D’Agostino(University of Cambridge)Sarath Ranganathan(University of Cambridge)M. Wald(Israel Atomic Energy Commission)
Advanced Materials Characterization TechniquesForce Microscopy Techniques and ApplicationsSurface and Thin Film PhenomenaGrain boundaryField ion microscopeMaterials scienceDislocationTungstenCondensed matter physicsCoincidenceLattice (music)Boundary (topology)Crystallography
Funding
- Forskningsrådet om Hälsa, Arbetsliv och Välfärd
Citations
541
FWCI
15.48
field-weighted impact
References
16
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99%
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