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Phase imaging and stiffness in tapping-mode atomic force microscopy

Surface Science · 1997 · Vol. 375(2-3) · pp. L385–L391
Sergei MagonovVirgil B. ElingsMyung‐Hwan Whangbo
Force Microscopy Techniques and ApplicationsNear-Field Optical MicroscopyAdhesion, Friction, and Surface InteractionsTappingAmplitudePhase (matter)StiffnessOscillation (cell signaling)Atomic force microscopyChemistryMaterials scienceMolecular physicsOptics
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Phase imaging and stiffness in tapping-mode atomic force microscopy · Scinovex