article
Rietveld analysis software for J-PARC
Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2008 · Vol. 600(1) · pp. 94–96
R. Oishi✉(High Energy Accelerator Research Organization)Masao Yonemura(Ibaraki University)Y. NishimakiShuki Torii(High Energy Accelerator Research Organization)Akinori Hoshikawa(Ibaraki University)Tōru Ishigaki(Ibaraki University)Takahiro Morishima(High Energy Accelerator Research Organization)Kazuhiro Mori(Kyoto University of Education)Takashi Kamiyama(High Energy Accelerator Research Organization)
X-ray Diffraction in CrystallographyNuclear Physics and ApplicationsChemical Synthesis and CharacterizationRietveld refinementSuiteSoftwareSoftware suiteGraphical user interfaceComputer scienceNeutronVisualizationComputer graphics (images)Crystallography
Citations
554
FWCI
1.05
field-weighted impact
References
14
Percentile
76%
vs. same field & year
Citations per year
Cited by
A lithium superionic conductor
Nature Materials · 2011 · 4,763 citations
References
A correction for powder diffraction peak asymmetry due to axial divergence
Journal of Applied Crystallography · 1994 · 1,229 citations
Citation Network
How this paper connects to the literature. Drag to explore, click any node to open that paper.